This course covers the practical aspects of using the 6 metrology instruments (atomic force microscope, Spectrophotometer, Surface profiler, Interferometric surface profiler, Laser interferometer, and Modulation transfer function analyzer) equipped in the CAPT lab to measure the optical characteristics of optical components. The course will include 8 hours of lecture to introduce the theoretical measurement principles and the operation principles of the instruments. In addition, 8 hours of hand-on instruction designed to give students an opportunity to learn using the machines.
Tim Lei is an assistant professor in the Department of Electrical Engineering at the
University of Colorado Denver. He is an expert in ultrafast lasers and nonlinear optical
spectroscopic techniques. He is currently developing some optical diagnostic
equipment to find cancers without biopsies. In the past, he has successfully traced
molecular motions on metal surfaces with fast optical pulses and has studied potential
inorganic molecules that can be used to generate hydrogen directly from sunlight with
optical techniques. He teaches graduate level optics classes, such as optical
engineering and bio-optics, regularly in UC-Denver.